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VTS
2005
IEEE
162views Hardware» more  VTS 2005»
16 years 1 months ago
Low-Cost Alternate EVM Test for Wireless Receiver Systems
† In digital radio applications, error-vector-magnitude (EVM) is the primary specification which quantifies the performance of digital modulation implemented in silicon. Producti...
Achintya Halder, Abhijit Chatterjee
ESE
2006
95views Database» more  ESE 2006»
15 years 7 months ago
Input validation analysis and testing
This research addresses the problem of statically analyzing input command syntax as defined in interface and requirements specifications and then generating test cases for dynamic ...
Jane Huffman Hayes, Jeff Offutt
DATE
2006
IEEE
115views Hardware» more  DATE 2006»
16 years 1 months ago
Optimal periodic testing of intermittent faults in embedded pipelined processor applications
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
Nektarios Kranitis, Andreas Merentitis, N. Laoutar...
HVC
2005
Springer
97views Hardware» more  HVC 2005»
16 years 28 days ago
An Extensible Open-Source Compiler Infrastructure for Testing
Testing forms a critical part of the development process for large-scale software, and there is growing need for automated tools that can read, represent, analyze, and transform th...
Daniel J. Quinlan, Shmuel Ur, Richard W. Vuduc
SIGIR
2004
ACM
16 years 25 days ago
Forming test collections with no system pooling
Forming test collection relevance judgments from the pooled output of multiple retrieval systems has become the standard process for creating resources such as the TREC, CLEF, and...
Mark Sanderson, Hideo Joho