† In digital radio applications, error-vector-magnitude (EVM) is the primary specification which quantifies the performance of digital modulation implemented in silicon. Producti...
This research addresses the problem of statically analyzing input command syntax as defined in interface and requirements specifications and then generating test cases for dynamic ...
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
Nektarios Kranitis, Andreas Merentitis, N. Laoutar...
Testing forms a critical part of the development process for large-scale software, and there is growing need for automated tools that can read, represent, analyze, and transform th...
Forming test collection relevance judgments from the pooled output of multiple retrieval systems has become the standard process for creating resources such as the TREC, CLEF, and...