6251 search results - page 875 / 1251 » Randomness, Computability, and Density |
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DATE
2006
IEEE
16 years 1 months ago
2006
IEEE
Ever-increasing integrated circuit (IC) power densities and peak temperatures threaten reliability, performance, and economical cooling. To address these challenges, thermal analy...
220
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GLVLSI
2006
IEEE
16 years 1 months ago
2006
IEEE
Process technology and environment-induced variability of gates and wires in VLSI circuits make timing analyses of such circuits a challenging task. Process variation can have a s...
201
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ICPADS
2006
IEEE
16 years 1 months ago
2006
IEEE
One of the major factors that can potentially slow down widespread use of embedded chip multiprocessors is lack of efficient software support. In particular, automated code paral...
213
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VLSID
2006
IEEE
16 years 1 months ago
2006
IEEE
This tutorial present the key aspects of design challenges and its solutions that are being experienced in VLSI design in the era of nano technology. The focus will be on design c...
206
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WIOPT
2006
IEEE
16 years 1 months ago
2006
IEEE
— This paper presents the first analytical model for ad hoc networks equipped with multiple-input multiple-output (MIMO) radios using space-time coding (STC) that considers the ...