6568 search results - page 377 / 1314 » Reducing the Complexity of Reductions |
125
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ICCAD
2006
IEEE
16 years 4 months ago
2006
IEEE
Defect tolerance is a major issue in nano computing. In this paper, an application-independent defect tolerant scheme for reconfigurable crossbar nano-architectures is presented....
180
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ICC
2008
IEEE
16 years 2 months ago
2008
IEEE
—An improved SINR metric is proposed for the random beamforming scheme introduced by Sharif and Hassibi, when the channel observation used to compute the SINR is known to be nois...
188
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SOCC
2008
IEEE
16 years 2 months ago
2008
IEEE
— A methodology is proposed to reduce power/ground and substrate coupling noise by randomizing the clock signal. A pseudo-random number generation algorithm is used to produce a ...
170
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ISCAS
2007
IEEE
16 years 1 months ago
2007
IEEE
—On-chip decoupling capacitors (decaps) are generally used to reduce power supply noise. Passive decap designs are reaching their limits in 90nm CMOS technology due to higher ope...
193
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IWANN
2007
Springer
16 years 1 months ago
2007
Springer
Abstract. Steganalysis consists in classifying documents as steganographied or genuine. This paper presents a methodology for steganalysis based on a set of 193 features with two m...