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ICCAD
1996
IEEE
85views Hardware» more  ICCAD 1996»
15 years 12 months ago
Exploiting regularity for low-power design
Abstract -- Current day behavioral-synthesis techniques produce architectures that are power-inefficient in the interconnect. Experiments have demonstrated that in synthesized desi...
Renu Mehra, Jan M. Rabaey
ICCAD
1996
IEEE
131views Hardware» more  ICCAD 1996»
15 years 12 months ago
Multi-level logic optimization for low power using local logic transformations
In this paper we present an ecient technique to reduce the switching activity in a CMOS combinational logic network based on local logic transformations. These transformations con...
Qi Wang, Sarma B. K. Vrudhula
ATS
2004
IEEE
108views Hardware» more  ATS 2004»
15 years 11 months ago
Rapid and Energy-Efficient Testing for Embedded Cores
Conventional serial connection of internal scan chains brings the power and time penalty. A novel parallel core wrapper design (pCWD) approach is presented in this paper for reduc...
Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman ...
DSD
2004
IEEE
169views Hardware» more  DSD 2004»
15 years 11 months ago
Shift Invert Coding (SINV) for Low Power VLSI
Low power VLSI circuit design is one of the most important issues in present day technology. One of the ways of reducing power in a CMOS circuit is to reduce the number of transit...
Jayapreetha Natesan, Damu Radhakrishnan
DATE
2010
IEEE
156views Hardware» more  DATE 2010»
15 years 10 months ago
Defect aware X-filling for low-power scan testing
Various X-filling methods have been proposed for reducing the shift and/or capture power in scan testing. The main drawback of these methods is that X-filling for low power leads t...
S. Balatsouka, V. Tenentes, Xrysovalantis Kavousia...