6147 search results - page 1125 / 1230 » Requirements, Architectures and Risks |
181
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DAC
2004
ACM
16 years 7 months ago
2004
ACM
Long design cycles due to the inability to predict silicon realities is a well-known problem that plagues analog/RF integrated circuit product development. As this problem worsens...
191
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
As feature sizes shrink, transient failures of on-chip network links become a critical problem. At the same time, many applications require guarantees on both message arrival prob...
176
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
We obtain analytically, the energy optimal speed profile of a generic multi-speed device with a discrete set of speeds, to execute a given task within a given time. Current implem...
178
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
ASIC provides more than an order of magnitude advantage in terms of density, speed, and power requirement per gate. However, economic (cost of masks) and technological (deep micro...
157
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DAC
2006
ACM
16 years 7 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...