2778 search results - page 438 / 556 » Reuse Technique in Hardware Design |
228
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ICCD
2008
IEEE
16 years 3 months ago
2008
IEEE
— Run-time Active Leakage Reduction (RALR) is a recent technique and aims at aggressively reducing leakage power consumption. This paper studies the feasibility of RALR from the ...
201
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ICCD
2006
IEEE
16 years 3 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
174
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ICCD
2005
IEEE
16 years 3 months ago
2005
IEEE
Designing temperature-aware microarchitectures for microprocessors at new technologies is becoming a critical requirement due to the exponentially increasing on-chip power density...
178
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ICCD
2004
IEEE
16 years 3 months ago
2004
IEEE
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...
168
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ICCD
2004
IEEE
16 years 3 months ago
2004
IEEE
The increasing clock frequencies in high-end industrial circuits bring new routing challenges that can not be handled by traditional algorithms. An important design automation pro...