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PRDC
2000
IEEE
15 years 11 months ago
Transient errors and rollback recovery in LZ compression
This paper analyzes the data integrity of one of the most widely used lossless data compression techniques, Lempel-Ziv (LZ) compression. In this algorithm, because the data recons...
Wei-Je Huang, Edward J. McCluskey
DATE
1999
IEEE
194views Hardware» more  DATE 1999»
15 years 11 months ago
Algorithms for Solving Boolean Satisfiability in Combinational Circuits
Boolean Satisfiability is a ubiquitous modeling tool in Electronic Design Automation, It finds application in test pattern generation, delay-fault testing, combinational equivalen...
Luís Guerra e Silva, Luis Miguel Silveira, ...
ISCA
1999
IEEE
94views Hardware» more  ISCA 1999»
15 years 11 months ago
A Performance Comparison of Contemporary DRAM Architectures
In response to the growing gap between memory access time and processor speed, DRAM manufacturers have created several new DRAM architectures. This paper presents a simulation-bas...
Vinodh Cuppu, Bruce L. Jacob, Brian Davis, Trevor ...
ICCAD
1998
IEEE
105views Hardware» more  ICCAD 1998»
15 years 11 months ago
Fanout optimization under a submicron transistor-level delay model
In this paper we present a new fanout optimization algorithm which is particularly suitable for digital circuits designed with submicron CMOS technologies. Restricting the class o...
Pasquale Cocchini, Massoud Pedram, Gianluca Piccin...
VTS
1998
IEEE
98views Hardware» more  VTS 1998»
15 years 11 months ago
Experimental Results for IDDQ and VLV Testing
An experimental test chip was designed and manufactured to evaluate different test techniques. Based on the results presented in the wafer probe, 309 out of 5491 dies that passed ...
Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu,...