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ERSHOV
2006
Springer
15 years 11 months ago
A Versioning and Evolution Framework for RDF Knowledge Bases
We present an approach to support the evolution of online, distributed, reusable, and extendable ontologies based on the RDF data model. The approach works on the basis of atomic c...
Sören Auer, Heinrich Herre
3DIM
2001
IEEE
15 years 11 months ago
A Self-Referenced Hand-Held Range Sensor
Due to its portability and great maneuverability, a handheld range sensor is a flexible solution or complement to efficiently digitize the 3-D shape for a wide variety of objects....
Patrick Hébert
AIPR
2003
IEEE
15 years 11 months ago
Defect Detection on Patterned Jacquard Fabric
The techniques for defect detection on plain (unpatterned) fabrics have been well developed nowadays. This paper is on developing visual inspection methods for defect detection on...
Henry Y. T. Ngan, Grantham K. H. Pang, S. P. Yung,...
ASPDAC
2001
ACM
82views Hardware» more  ASPDAC 2001»
15 years 11 months ago
Towards the logic defect diagnosis for partial-scan designs
Loical defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fails testing. In the la...
Shi-Yu Huang
CEC
2003
IEEE
15 years 11 months ago
Playing in continuous spaces: some analysis and extension of population-based incremental learning
- As an alternative to traditional Evolutionary Algorithms (EAs), Population-Based Incremental Learning (PBIL) maintains a probabilistic model of the best individual(s). Originally...
Bo Yuan, Marcus Gallagher