Technology scaling allows the integration of billions of transistors on the same die but CAD tools struggle in keeping up with the increasing design complexity. Design productivit...
In this paper, we propose a novel fault-oriented test generation methodology for detection and isolation of faults in analog circuits. Given the description of the circuit-underte...
Electroencephalographic (EEG) correlates of driving performance were studied using an event-related lane-departure paradigm. High-density EEG data were analyzed using independent c...
Abstract The EGEE grid offers the necessary infrastructure and resources for reducing the running time of particle tracking Monte-Carlo applications like GATE. However, efforts are...
Sorina Camarasu-Pop, Tristan Glatard, Jakub T. Mos...
As multi-core processor systems become more and more widespread, the demand for efficient parallel algorithms also propagates into the field of computer graphics. This is especial...
Bernhard Thomaszewski, Simon Pabst, Wolfgang Bloch...