As VLSI circuit speeds have increased, reliable chip and system design can no longer be performed without accurate threedimensional interconnect models. In this paper, we describe...
Nuno Alexandre Marques, Mattan Kamon, Jacob White,...
Exploring a large portion of the microprocessor design space requires the rapid development of efficient simulators. While some systems support rapid model development through the...
The impact of technology scaling on three run-time leakage reduction techniques (Input Vector Control, Body Bias Control and Power Supply Gating) is evaluated by determining limit...
Yuh-Fang Tsai, David Duarte, Narayanan Vijaykrishn...
We describe a new extraction tool, EMX (Electro-Magnetic eXtractor), for the analysis of RF, analog and high-speed digital circuits. EMX is a fast full-wave field solver. It incor...
Scan-based silicon debug is a technique that can be used to help find design errors in prototype silicon more quickly. One part of this technique involves the inclusion of breakpo...
Bart Vermeulen, Mohammad Zalfany Urfianto, Sandeep...