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DAC
2004
ACM
15 years 11 months ago
A methodology to improve timing yield in the presence of process variations
The ability to control the variations in IC fabrication process is rapidly diminishing as feature sizes continue towards the sub-100 nm regime. As a result, there is an increasing...
Sreeja Raj, Sarma B. K. Vrudhula, Janet Meiling Wa...
DATE
2004
IEEE
144views Hardware» more  DATE 2004»
15 years 11 months ago
A Framework for Battery-Aware Sensor Management
A distributed sensor network (DSN) designed to cover a given region R, is said to be alive if there is at least one subset of sensors that can collectively cover (sense) the regio...
Sridhar Dasika, Sarma B. K. Vrudhula, Kaviraj Chop...
CIKM
2006
Springer
15 years 11 months ago
Mining compressed commodity workflows from massive RFID data sets
Radio Frequency Identification (RFID) technology is fast becoming a prevalent tool in tracking commodities in supply chain management applications. The movement of commodities thr...
Hector Gonzalez, Jiawei Han, Xiaolei Li
FOCS
1995
IEEE
15 years 11 months ago
Disjoint Paths in Densely Embedded Graphs
We consider the following maximum disjoint paths problem (mdpp). We are given a large network, and pairs of nodes that wish to communicate over paths through the network — the g...
Jon M. Kleinberg, Éva Tardos
SIGGRAPH
1997
ACM
15 years 11 months ago
View-dependent refinement of progressive meshes
Level-of-detail (LOD) representations are an important tool for realtime rendering of complex geometric environments. The previously introduced progressive mesh representation def...
Hugues Hoppe
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