Model composition helps designers managing complexities by modeling different system views separately, and later compose them into an integrated model. In the past years, researche...
In the paper, a methodology of developing checkers for communication protocol testing is presented. It was used to develop checker to test IP cores communication protocol implemen...
Defect density and defect size distributions (DDSDs) are key parameters used in IC yield loss predictions. Traditionally, memories and specialized test structures have been used t...
Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jas...
This paper reports results obtained in benchmark tests conducted within the ARPA Spoken Language program in November and December of 1993. In addition to ARPA contractors, partici...
David S. Pallett, Jonathan G. Fiscus, William M. F...
We describe an approach to training a statistical parser from a bracketed corpus, and demonstrate its use in a software testing application that translates English speci cations i...