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ITC
2003
IEEE
109views Hardware» more  ITC 2003»
16 years 15 days ago
The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data
While the IEEE P1500 standards working group is on the verge of recommending a standard test interface for "non-mergeable" cores, a need was felt to adopt a standard met...
Michael G. Wahl, Sudipta Bhawmik, Kamran Zarrineh,...
EDCC
1999
Springer
15 years 11 months ago
Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms
Abstract. The paper presents a new approach to transparent BIST for wordoriented RAMs which is based on the transformation of March transparent test algorithms to the symmetric ver...
Vyacheslav N. Yarmolik, I. V. Bykov, Sybille Helle...
DAWAK
2006
Springer
15 years 11 months ago
Mixed Decision Trees: An Evolutionary Approach
In the paper, a new evolutionary algorithm (EA) for mixed tree learning is proposed. In non-terminal nodes of a mixed decision tree different types of tests can be placed, ranging ...
Marek Kretowski, Marek Grzes
ASPLOS
2011
ACM
14 years 10 months ago
Specifying and checking semantic atomicity for multithreaded programs
In practice, it is quite difficult to write correct multithreaded programs due to the potential for unintended and nondeterministic interference between parallel threads. A funda...
Jacob Burnim, George C. Necula, Koushik Sen
IOLTS
2000
IEEE
105views Hardware» more  IOLTS 2000»
15 years 11 months ago
Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faults
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
Patrick Girard, Christian Landrault, Serge Pravoss...