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179
Voted
VLSID
2004
IEEE
135views VLSI» more  VLSID 2004»
16 years 7 months ago
Integrating Self Testability with Design Space Exploration by a Controller based Estimation Technique
Recent research for testable designs has focussed on inserting test structures by re-arranging an Register-TransferLevel (RTL) data path generated from a behavioural description t...
M. S. Gaur, Mark Zwolinski
250
Voted
ISBI
2011
IEEE
14 years 11 months ago
Sparse topological data recovery in medical images
For medical image analysis, the test statistic of the measurements is usually constructed at every voxels in space and thresholded to determine the regions of significant signals...
Moo K. Chung, Hyekyoung Lee, Peter T. Kim, Jong Ch...
DAC
2011
ACM
14 years 7 months ago
Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect
Variations in delay caused by within-die and die-to-die process variations and SOI history effect increase timing margins and reduce performance. In order to develop mitigation te...
Jim Aarestad, Charles Lamech, Jim Plusquellic, Dhr...
DSN
2000
IEEE
15 years 12 months ago
Benchmarking Anomaly-Based Detection Systems
Anomaly detection is a key element of intrusiondetection and other detection systems in which perturbations of normal behavior suggest the presence of intentionally or unintention...
Roy A. Maxion, Kymie M. C. Tan
196
Voted
ECIR
2008
Springer
15 years 9 months ago
The Importance of Link Evidence in Wikipedia
Wikipedia is one of the most popular information sources on the Web. The free encyclopedia is densely linked. The link structure in Wikipedia differs from the Web at large: interna...
Jaap Kamps, Marijn Koolen