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ICML
2009
IEEE
16 years 8 months ago
Deep transfer via second-order Markov logic
Standard inductive learning requires that training and test instances come from the same distribution. Transfer learning seeks to remove this restriction. In shallow transfer, tes...
Jesse Davis, Pedro Domingos
GLVLSI
2006
IEEE
101views VLSI» more  GLVLSI 2006»
16 years 1 months ago
Measurement and characterization of pattern dependent process variations of interconnect resistance, capacitance and inductance
Process variations have become a serious concern for nanometer technologies. The interconnect and device variations include interand intra-die variations of geometries, as well as...
Xiaoning Qi, Alex Gyure, Yansheng Luo, Sam C. Lo, ...
177
Voted
GECCO
2005
Springer
124views Optimization» more  GECCO 2005»
16 years 1 months ago
Generalized benchmark generation for dynamic combinatorial problems
Several general purpose benchmark generators are now available in the literature. They are convenient tools in dynamic continuous optimization as they can produce test instances w...
Abdulnasser Younes, Paul H. Calamai, Otman A. Basi...
INEX
2005
Springer
16 years 1 months ago
What Do Users Think of an XML Element Retrieval System?
We describe the University of Amsterdam’s participation in the INEX 2005 Interactive Track, mainly focusing on a comparative experiment, in which the baseline system Daffodil/HyR...
Jaap Kamps, Börkur Sigurbjörnsson
PASTE
2004
ACM
16 years 1 months ago
Elided conditionals
Many software testing and automated debugging tools rely on structural coverage techniques. Such tools implicitly assume a relation between individual control-flow choices made i...
Manos Renieris, Sébastien Chan-Tin, Steven ...