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202
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ITC
1993
IEEE
110views Hardware» more  ITC 1993»
15 years 11 months ago
Novel Test Pattern Generators for Pseudo-Exhaustive Testing
ÐPseudoexhaustive testing of a combinational circuit involves applying all possible input patterns to all its individual output cones. The testing ensures detection of all detecta...
Rajagopalan Srinivasan, Sandeep K. Gupta, Melvin A...
209
Voted
JSYML
2000
110views more  JSYML 2000»
15 years 7 months ago
Basic Logic: Reflection, Symmetry, Visibility
We introduce a sequent calculus B for a new logic, named basic logic. The aim of basic logic is to find a structure in the space of logics. Classical, intuitionistic, quantum and ...
Giovanni Sambin, Giulia Battilotti, Claudia Faggia...
194
Voted
JDA
2008
72views more  JDA 2008»
15 years 7 months ago
Semi-local longest common subsequences in subquadratic time
For two strings a, b of lengths m, n respectively, the longest common subsequence (LCS) problem consists in comparing a and b by computing the length of their LCS. In this paper, ...
Alexander Tiskin
245
Voted
PVLDB
2008
157views more  PVLDB 2008»
15 years 6 months ago
SEDA: a system for search, exploration, discovery, and analysis of XML Data
Keyword search in XML repositories is a powerful tool for interactive data exploration. Much work has recently been done on making XML search aware of relationship information emb...
Andrey Balmin, Latha S. Colby, Emiran Curtmola, Qu...
229
Voted
MTDT
2003
IEEE
164views Hardware» more  MTDT 2003»
16 years 29 days ago
Applying Defect-Based Test to Embedded Memories in a COT Model
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
Robert C. Aitken