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106
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SCAM
2009
IEEE
16 years 1 months ago
An Assessment of Type-3 Clones as Detected by State-of-the-Art Tools
Rebecca Tiarks, Rainer Koschke, Raimar Falke
133
Voted
SCAM
2009
IEEE
16 years 1 months ago
Evolution of Type-1 Clones
Nils Göde
128
Voted
SCAM
2009
IEEE
16 years 1 months ago
Static Estimation of Test Coverage
Tiago L. Alves, Joost Visser
123
Voted
SCAM
2009
IEEE
16 years 1 months ago
Lightweight Techniques for Tracking Unique Program Statements
Jaime Spacco, Chadd C. Williams