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MIDDLEWARE
2009
Springer
15 years 11 months ago
Automatic Stress Testing of Multi-tier Systems by Dynamic Bottleneck Switch Generation
Abstract. The performance of multi-tier systems is known to be significantly degraded by workloads that place bursty service demands on system resources. Burstiness can cause queu...
Giuliano Casale, Amir Kalbasi, Diwakar Krishnamurt...
151
Voted
DATE
2006
IEEE
82views Hardware» more  DATE 2006»
16 years 1 months ago
Concurrent core test for SOC using shared test set and scan chain disable
A concurrent core test approach is proposed to reduce the test cost of SOC. Multiple cores in SOC can be tested simultaneously by using a shared test set and scan chain disable. P...
Gang Zeng, Hideo Ito
118
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ICCAD
2004
IEEE
99views Hardware» more  ICCAD 2004»
16 years 3 months ago
SPIN-TEST: automatic test pattern generation for speed-independent circuits
Feng Shi, Yiorgos Makris