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154

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ISSRE
2008
IEEE

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RUGRAT: Runtime Test Case Generation Using Dynamic Compilers

16 years 1 months ago

RUGRAT: Runtime Test Case Generation Using Dynamic Compilers

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Ben Breech, Lori L. Pollock, John Cavazos

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128

KBSE
2008
IEEE

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Heuristics for Scalable Dynamic Test Generation

16 years 1 months ago

Heuristics for Scalable Dynamic Test Generation

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Jacob Burnim, Koushik Sen

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153

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FMICS
2007
Springer

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Automatic Interoperability Test Case Generation Based on Formal Definitions

16 years 1 months ago

Automatic Interoperability Test Case Generation Based on Formal Definitions

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Alexandra Desmoulin, César Viho

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131

TAP
2007
Springer

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Using Contracts and Boolean Queries to Improve the Quality of Automatic Test Generation

16 years 1 months ago

Using Contracts and Boolean Queries to Improve the Quality of Automatic Test Generation

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Lisa (Ling) Liu, Bertrand Meyer, Bernd Schoeller

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179

DEPCOS
2006
IEEE

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Model-based Automatic Test Generation for Event-Driven Embedded Systems using Model Checkers

16 years 1 months ago

Model-based Automatic Test Generation for Event-Driven Embedded Systems using Model Checkers

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Zoltán Micskei, István Majzik

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