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ICCAD
1999
IEEE
72views Hardware» more  ICCAD 1999»
15 years 11 months ago
Validation and test generation for oscillatory noise in VLSI interconnects
: Inductance of on-chip interconnects gives rise to signal overshoots and undershoots that can cause logic errors. By considering technology trends, we show that in 0.13
Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer
149
Voted
KBSE
1999
IEEE
15 years 11 months ago
Automatic Generation of Test Oracles-From Pilot Studies to Application
Martin S. Feather, Benjamin D. Smith
142
Voted
ESEC
1999
Springer
15 years 11 months ago
Using Model Checking to Generate Tests from Requirements Specifications
Angelo Gargantini, Constance L. Heitmeyer
ATS
1998
IEEE
106views Hardware» more  ATS 1998»
15 years 11 months ago
A Test Pattern Generation Algorithm Exploiting Behavioral Information
This paper aims at broadening the scope of hierarchical ATPG to the behavioral-level The main problem of using behavioral information for ATPG is the mismatch of timing models bet...
Silvia Chiusano, Fulvio Corno, Paolo Prinetto