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168
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VTS
1999
IEEE
15 years 11 months ago
1999
IEEE
High-level test pattern generation is today a widely investigated research topic. The present paper proposes a fully automated, simulation-based ATPG system, to address test patte...
156
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ATS
2009
IEEE
16 years 2 months ago
2009
IEEE
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets,...
184
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ASYNC
2006
IEEE
16 years 1 months ago
2006
IEEE
We propose a low-overhead method for delay fault testing in high-speed asynchronous pipelines. The key features of our work are: (i) testing strategies can be administered using l...
191
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TACAS
2005
Springer
16 years 22 days ago
2005
Springer
This paper addresses the problem of generating symbolic test cases for testing the conformance of a black-box implementation with respect to a specification, in the context of rea...
233
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ACMSE
2006
ACM
16 years 1 months ago
2006
ACM
In this paper we consider the problem of automatically generating test suites associated with web-based enterprise systems. In particular, we discuss the construction of a tool de...