5855 search results - page 212 / 1171 » Test generation and minimization with |
215
click to vote
SIGMOD
2010
ACM
15 years 11 months ago
2010
ACM
A database application differs form regular applications in that some of its inputs may be database queries. The program will execute the queries on a database and may use any re...
211
click to vote
CASES
2007
ACM
15 years 11 months ago
2007
ACM
Embedded systems are often used in safety-critical environments. Thus, thorough testing of them is mandatory. A quite active research area is the automatic test-case generation fo...
167
click to vote
DATE
2006
IEEE
16 years 1 months ago
2006
IEEE
This paper presents a wrapper and test access mechanism design for multi-clock domain SoCs that consists of cores with different clock frequencies during test. We also propose a t...
190
click to vote
ETS
2006
IEEE
16 years 1 months ago
2006
IEEE
In this paper we address the test scheduling problem for Builtin Self-tested (BISTed) embedded SRAMs (e-SRAMs) when Data Retention Faults (DRFs) are considered. The proposed test ...
223
click to vote
DFT
2002
IEEE
16 years 7 days ago
2002
IEEE
This paper describes a new compression/decompression methodology for using an embedded processor to test the other components of a system-on-a-chip (SoC). The deterministic test v...