5855 search results - page 264 / 1171 » Test generation and minimization with |
217
Voted
QSIC
2005
IEEE
16 years 1 months ago
2005
IEEE
This paper proposes a stochastic voting for testing a large number of Web Services (WS) under group testing. In the future, a large number of WS will be available and they need to...
190
Voted
COMPSAC
2003
IEEE
16 years 22 days ago
2003
IEEE
Usual techniques for automatic test data generation are based on the assumption that a complete oracle will be available during the testing process. However, there are programs fo...
182
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ATS
1998
IEEE
15 years 11 months ago
1998
IEEE
In mixed-mode BIST, deterministic test patterns are generated with on-chip hardware to detect the random-pattern-resistant (r.p.r.) faults that are missed by the pseudo-random pat...
193
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EMSOFT
2006
Springer
15 years 11 months ago
2006
Springer
A key problem for effective unit testing is the difficulty of partitioning large software systems into appropriate units that can be tested in isolation. We present an approach th...
227
Voted
DFT
2006
IEEE
15 years 9 months ago
2006
IEEE
As the technology enters the nano dimension, the inherent unreliability of nanoelectronics is making fault-tolerant architectures increasingly necessary in building nano systems. ...