624 search results - page 37 / 125 » Test set compaction algorithms for combinational circuits |
148
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DATE
2009
IEEE
16 years 1 months ago
2009
IEEE
This paper uses under-approximation of unreachable states of a design to derive incomplete specification of combinational logic. The resulting incompletely-specified functions are...
175
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DAC
2004
ACM
15 years 10 months ago
2004
ACM
In a CMOS combinational logic circuit, the subthreshold leakage current in the standby state depends on the state of the inputs. In this paper we present a new approach to identif...
164
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ISQED
2007
IEEE
16 years 23 days ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
195
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DAC
2004
ACM
15 years 10 months ago
2004
ACM
This paper presents a method of generating tests for transition faults using tests for stuck-at faults such that the peak power is the minimum possible using a given set of tests ...
174
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COR
2007
15 years 6 months ago
2007
A new problem encoding is devised for the minimum span frequency assignment problem in wireless communications networks which is compact and general. Using the new encoding, which...