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Testing Nondeterminate Systems
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MUC
1995
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Natural Language Processing
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SRI International FASTUS system: MUC-6 test results and analysis
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Douglas E. Appelt, Jerry R. Hobbs, John Bear, Davi...
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VLSID
1995
IEEE
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VLSI
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An efficient automatic test generation system for path delay faults in combinational circuits
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Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...
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MUC
1991
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McDonnell Douglas Electronic Systems Company: MUC-3 test results and analysis
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David de Hilster, Amnon Meyers
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MUC
1991
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SRI International's TACITUS system: MUC-3 test results and analysis
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Jerry R. Hobbs
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MUC
1991
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New York University PROTEUS system: MUC-3 test results and analysis
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Ralph Grishman, John Sterling, Catherine Macleod
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