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ICSE
2009
IEEE-ACM
15 years 11 months ago
Automated Testing of a Converged Conferencing Application
Venkita Subramonian, Eric Cheung, Gerald M. Karam
ISSTA
2000
ACM
15 years 11 months ago
A framework for testing database applications
David Chays, Saikat Dan, Phyllis G. Frankl, Filipp...
ITC
1998
IEEE
79views Hardware» more  ITC 1998»
15 years 11 months ago
An almost full-scan BIST solution-higher fault coverage and shorter test application time
Huan-Chih Tsai, Sudipta Bhawmik, Kwang-Ting Cheng