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156
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DATE
2006
IEEE
16 years 1 months ago
2006
IEEE
— In this paper, we present a test generation framework for testing of quantum cellular automata (QCA) circuits. QCA is a nanotechnology that has attracted significant recent at...
195
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GLVLSI
2006
IEEE
16 years 1 months ago
2006
IEEE
Functional verification is one of the major bottlenecks in microprocessor design. Simulation-based techniques are the most widely used form of processor verification. Efficient ...
193
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CEC
2005
IEEE
16 years 1 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
216
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SEFM
2005
IEEE
16 years 1 months ago
2005
IEEE
The development of test cases is an important issue for testing software, communication protocols and other reactive systems. A number of methods are known for the development of ...
186
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APAQS
2000
IEEE
15 years 12 months ago
2000
IEEE
In the manufacturing domain, few new distributed systems are built ground-up; most contain wrapped legacy components. While the legacy components themselves are already well-teste...