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168
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DATE
2000
IEEE
15 years 12 months ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
208
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DATE
1999
IEEE
15 years 12 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
232
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AOSE
2008
Springer
15 years 9 months ago
2008
Springer
Abstract. Software agents are a promising technology for today's complex, distributed systems. Methodologies and techniques that address testing and reliability of multi agent...
225
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CORR
2010
Springer
2010
Springer
Reliable Mining of Automatically Generated Test Cases from Software Requirements Specification (SRS)
15 years 7 months ago
Writing requirements is a two-way process. In this paper we use to classify Functional Requirements (FR) and Non Functional Requirements (NFR) statements from Software Requirement...
232
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ICSE
2009
IEEE-ACM
15 years 5 months ago
2009
IEEE-ACM
Configurable software lets users customize applications in many ways, and is becoming increasingly prevalent. Regression testing is an important but expensive way to build confide...