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DATE
2002
IEEE
98views Hardware» more  DATE 2002»
16 years 16 days ago
A Test Design Method for Floating Gate Defects (FGD) in Analog Integrated Circuits
A unified approach to fault simulation for FGDs is introduced. Instead of a direct fault simulation, the proposed approach calculates indirectly from the simulator output the set...
Michael Pronath, Helmut E. Graeb, Kurt Antreich
DAC
1996
ACM
15 years 11 months ago
Test Point Insertion: Scan Paths through Combinational Logic
We propose a low-overhead scan design methodology which employs a new test point insertion technique to establish scan paths through the functional logic. The technique re-uses th...
Chih-Chang Lin, Malgorzata Marek-Sadowska, Kwang-T...
FSS
2007
82views more  FSS 2007»
15 years 7 months ago
An empirical test of some measurement-theoretic axioms for fuzzy sets
In the previous years some authors have been elaborating on the measurementtheoretic foundations of fuzzy set theory. A well-known problem in this approach is the difficult applic...
C. Desimpelaere, Thierry Marchant
178
Voted
MR
2007
66views Robotics» more  MR 2007»
15 years 7 months ago
Test structures for dielectric spectroscopy of thin films at microwave frequencies
This work describes the application of two different test structures to execute broadband microwave measurements of the dielectric constant of ceramic thin films. Coplanar wavegui...
Nicola Delmonte, B. E. Watts, G. Chiorboli, P. Cov...
CAEPIA
2011
Springer
14 years 7 months ago
Evaluating a Reinforcement Learning Algorithm with a General Intelligence Test
In this paper we apply the recent notion of anytime universal intelligence tests to the evaluation of a popular reinforcement learning algorithm, Q-learning. We show that a general...
Javier Insa-Cabrera, David L. Dowe, José He...