4930 search results - page 206 / 986 » Testing a Safety-Critical Application |
175
Voted
ICCAD
2002
IEEE
16 years 1 days ago
2002
IEEE
We study the undetectable faults in partial scan circuits under a test application scheme referred to as transparent-scan. The transparent-scan approach allows very aggressive tes...
161
Voted
ASPDAC
2000
ACM
15 years 10 months ago
2000
ACM
Testing embedded memories is becoming an industry-wide concern with the advent of deep-submicron technology and system-on-chip applications. We present a prototype chip for a progr...
167
click to vote
ICCAD
1997
IEEE
15 years 11 months ago
1997
IEEE
A built-in self-test (BIST) methodology to test system backplanes by using BIST functionality in each of its constituent boards is presented. Since the configurations of systems ...
177
click to vote
IPPS
2000
IEEE
15 years 11 months ago
2000
IEEE
This paper presents a family of simulators that have been developed for data-intensive applications, and a methodology to select the most efficient one based on a usersupplied req...
174
click to vote
FASE
2007
Springer
16 years 1 months ago
2007
Springer
Web applications are increasingly prominent in society, serving a wide variety of user needs. Engineers seeking to enhance, test, and maintain these applications and third-party pr...