11718 search results - page 454 / 2344 » Testing database applications |
209
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ICCD
2008
IEEE
16 years 4 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
209
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AMMA
2009
Springer
16 years 2 months ago
2009
Springer
Abstract. We present Turing Trade, a web-based game that is a hybrid of a Turing test and a prediction market. In this game, there is a mystery conversation partner, the “target,...
199
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VCIP
2003
15 years 9 months ago
2003
International recommendations for subjective video quality assessment (e.g., ITU-R BT.500-11) include specifications for how to perform many different types of subjective tests. S...
238
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EVOW
2001
Springer
16 years 4 days ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
237
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ISSRE
2007
IEEE
15 years 9 months ago
2007
IEEE
In industrial practice, information on the software field quality of a product is available too late in the software lifecycle to guide affordable corrective action. An important ...