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DDECS
2007
IEEE
175views Hardware» more  DDECS 2007»
16 years 25 days ago
Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair
—An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. A commonly used repair strategy is to equip memories with sp...
Philipp Öhler, Sybille Hellebrand, Hans-Joach...
FCT
2007
Springer
16 years 19 days ago
The Quantum Query Complexity of Algebraic Properties
We present quantum query complexity bounds for testing algebraic properties. For a set S and a binary operation on S, we consider the decision problem whether S is a semigroup or ...
Sebastian Dörn, Thomas Thierauf
ECAI
2008
Springer
15 years 8 months ago
Test Generation for Model-Based Diagnosis
This article formalises the dual problem to model-based diagnosis (MBD), i.e., generating tests to isolate multiple simultaneous faults. Using a standard propositional MBD framewo...
Gregory M. Provan
APPROX
2009
Springer
107views Algorithms» more  APPROX 2009»
16 years 1 months ago
Hierarchy Theorems for Property Testing
Referring to the query complexity of property testing, we prove the existence of a rich hierarchy of corresponding complexity classes. That is, for any relevant function q, we prov...
Oded Goldreich, Michael Krivelevich, Ilan Newman, ...
TVLSI
2008
89views more  TVLSI 2008»
15 years 6 months ago
Test Set Development for Cache Memory in Modern Microprocessors
Up to 53% of the time spent on testing current Intel microprocessors is needed to test on-chip caches, due to the high complexity of memory tests and to the large amount of transis...
Zaid Al-Ars, Said Hamdioui, Georgi Gaydadjiev, Sta...