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» The Complexity of Planarity Testing
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STOC
2007
ACM
137views Algorithms» more  STOC 2007»
16 years 7 months ago
Testing k-wise and almost k-wise independence
In this work, we consider the problems of testing whether a distribution over {0, 1}n is k-wise (resp. ( , k)-wise) independent using samples drawn from that distribution. For the...
Noga Alon, Alexandr Andoni, Tali Kaufman, Kevin Ma...
ISQED
2006
IEEE
107views Hardware» more  ISQED 2006»
16 years 1 months ago
On Optimizing Scan Testing Power and Routing Cost in Scan Chain Design
— With advanced VLSI manufacturing technology in deep submicron (DSM) regime, we can integrate entire electronic systems on a single chip (SoC). Due to the complexity in SoC desi...
Li-Chung Hsu, Hung-Ming Chen
NPAR
2006
ACM
16 years 29 days ago
Real-time watercolor illustrations of plants using a blurred depth test
We present techniques to create convincing high-quality watercolor illustrations of plants. Mainly focusing on the real-time rendering, we introduce methods to abstract the visual...
Thomas Luft, Oliver Deussen
186
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CSDA
2006
84views more  CSDA 2006»
15 years 7 months ago
Performing hypothesis tests on the shape of functional data
We explore different approaches for performing hypothesis tests on the shape of a mean function by developing general methodologies both, for the often assumed, i.i.d. error struc...
Gareth M. James, Ashish Sood
179
Voted
JUCS
2007
95views more  JUCS 2007»
15 years 6 months ago
Using Place Invariants and Test Point Placement to Isolate Faults in Discrete Event Systems
: This paper describes a method of using Petri net P-invariants in system diagnosis. To model this process a net oriented fault classification is presented. Hence, the considered d...
Iwan Tabakow