This paper describes the implementation of a test pattern language using STIL [1], the IEEE Standard Test Interface Language (1450-1999), in a next generation, open architecture A...
Design rules in advanced IC manufacturing processes are increasingly problematic for modern router architectures and algorithms. This paper first reviews types and causes of “d...
Flexible and distributed management systems based on mobile agents have certain advantages over centralized and static management architectures. However, security plays a decisive...
IC inductance extraction generally produces either port inductances based on simplified current path assumptions or a complete partial inductance matrix. Combining either of thes...
- This paper presents a methodology for concurrently optimizing an IC fabrication process and a standard cell library in order to maximize overall yield. The approach uses the Conc...
Arun N. Lokanathan, Jay B. Brockman, John E. Renau...