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ITC
2003
IEEE
327views Hardware» more  ITC 2003»
16 years 18 days ago
Case Study - Using STIL as Test Pattern Language
This paper describes the implementation of a test pattern language using STIL [1], the IEEE Standard Test Interface Language (1450-1999), in a next generation, open architecture A...
Daniel Fan, Steve Roehling, Rusty Carruth
ISPD
2003
ACM
73views Hardware» more  ISPD 2003»
16 years 18 days ago
Research directions for coevolution of rules and routers
Design rules in advanced IC manufacturing processes are increasingly problematic for modern router architectures and algorithms. This paper first reviews types and causes of “d...
Andrew B. Kahng
ISCC
2000
IEEE
125views Communications» more  ISCC 2000»
15 years 11 months ago
Security Requirements for Management Systems Using Mobile Agents
Flexible and distributed management systems based on mobile agents have certain advantages over centralized and static management architectures. However, security plays a decisive...
Helmut Reiser, Gerald Vogt
DAC
1999
ACM
15 years 11 months ago
IC Analyses Including Extracted Inductance Models
IC inductance extraction generally produces either port inductances based on simplified current path assumptions or a complete partial inductance matrix. Combining either of thes...
Michael W. Beattie, Lawrence T. Pileggi
DAC
1996
ACM
15 years 11 months ago
A Methodology for Concurrent Fabrication Process/Cell Library Optimization
- This paper presents a methodology for concurrently optimizing an IC fabrication process and a standard cell library in order to maximize overall yield. The approach uses the Conc...
Arun N. Lokanathan, Jay B. Brockman, John E. Renau...