This work presents a novel dynamic bias control technique to verify the circuit performance of the lowpower rail-to-rail input/output buffer amplifier, which can be operating in s...
Reducing leakage power and improving the reliability of data stored in the memory cells are both becoming challenging as technology scales down. While the smaller threshold voltag...
Vijay Degalahal, Narayanan Vijaykrishnan, Mary Jan...
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
Sukanta Das, Niloy Ganguly, Biplab K. Sikdar, Pari...
Recent advances in statistical inference and machine learning close the divide between simulation and classical optimization, thereby enabling more rigorous and robust microarchit...
We propose a Dynamic Face Recognition Committee Machine (DFRCM) consisting of five well-known state-of-the-art algorithms in this paper. In previous work, we have developed a stat...