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VTS
1997
IEEE
90views Hardware» more  VTS 1997»
15 years 11 months ago
SHOrt voltage elevation (SHOVE) test for weak CMOS ICs
A stress procedure for reliability screening, SHOrt Voltage Elevation (SHOVE) test, is analyzed here. During SHOVE, test vectors are run at higher-than-normal supply voltage for a...
Jonathan T.-Y. Chang, Edward J. McCluskey
LICS
1994
IEEE
15 years 11 months ago
Subtyping and Parametricity
In this paper we study the interaction of subtyping and parametricity. We describe a logic for a programming language with parametric polymorphism and subtyping. The logic support...
Gordon D. Plotkin, Martín Abadi, Luca Carde...
SIGGRAPH
2010
ACM
15 years 11 months ago
Unified simulation of elastic rods, shells, and solids
We develop an accurate, unified treatment of elastica. Following the method of resultant-based formulation to its logical extreme, we derive a higher-order integration rule, or el...
Sebastian Martin, Peter Kaufmann, Mario Botsch, Ei...
TPPP
1994
15 years 11 months ago
Time and Information in Sequential and Concurrent Computation
Time can be understood as dual to information in extant models of both sequential and concurrent computation. The basis for this duality is phase space, coordinatized by time and ...
Vaughan R. Pratt
FUZZIEEE
2007
IEEE
15 years 11 months ago
A Linguistic Multi-level Weighted Query Language to Represent User Information Needs
An ordinal fuzzy linguistic Information Retrieval System (IRS) based on a multi-level weighting scheme to represent the user queries, in a more flexible way, is proposed. The IRS a...
Enrique Herrera-Viedma, Antonio Gabriel Lóp...