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DAC
2004
ACM
16 years 8 months ago
Defining coverage views to improve functional coverage analysis
Coverage analysis is used to monitor the quality of the verification process. Reports provided by coverage tools help users identify areas in the design that have not been adequat...
Sigal Asaf, Eitan Marcus, Avi Ziv
DAC
2004
ACM
16 years 8 months ago
Simultaneous optimization of supply and threshold voltages for low-power and high-performance circuits in the leakage dominant e
Electrothermal couplings between supply voltage, operating frequency, power dissipation and die temperature have been shown to significantly impact the energy-delay-product (EDP) ...
Anirban Basu, Sheng-Chih Lin, Vineet Wason, Amit M...
DAC
2004
ACM
16 years 8 months ago
Retargetable profiling for rapid, early system-level design space exploration
Fast and accurate estimation is critical for exploration of any dece in general. As we move to higher levels of abstraction, on of complete system designs at each level of abstrac...
Lukai Cai, Andreas Gerstlauer, Daniel Gajski
DAC
2004
ACM
16 years 8 months ago
Defect tolerant probabilistic design paradigm for nanotechnologies
Recent successes in the development and self-assembly of nanoelectronic devices suggest that the ability to manufacture dense nanofabrics is on the near horizon. However, the trem...
Margarida F. Jacome, Chen He, Gustavo de Veciana, ...
DAC
2004
ACM
16 years 8 months ago
Leakage aware dynamic voltage scaling for real-time embedded systems
A five-fold increase in leakage current is predicted with each technology generation. While Dynamic Voltage Scaling (DVS) is known to reduce dynamic power consumption, it also cau...
Ravindra Jejurikar, Cristiano Pereira, Rajesh K. G...