Sciweavers

4305 search results - page 273 / 861
» The Test of Time
Sort
View
SIGCSE
2005
ACM
163views Education» more  SIGCSE 2005»
16 years 26 days ago
Using SeSFJava in teaching introductory network courses
Networking course projects are usually described by an informal specification and a collection of test cases. Students often misunderstand the specification or oversimplify it t...
Tamer Elsharnouby, A. Udaya Shankar
SCHEDULING
2008
97views more  SCHEDULING 2008»
15 years 6 months ago
Effective on-line algorithms for reliable due date quotation and large-scale scheduling
We consider the sequencing of a series of jobs that arrive at a single processor over time. At each job's arrival time, a due date must be quoted for the job, and the job must...
Philip Kaminsky, Zu-Hsu Lee
DFT
1999
IEEE
119views VLSI» more  DFT 1999»
15 years 11 months ago
RAMSES: A Fast Memory Fault Simulator
In this paper, we present a memory fault simulator called the Random Access Memory Simulator for Error Screening (RAMSES). Although it was designed based on some wellknown memory ...
Chi-Feng Wu, Chih-Tsun Huang, Cheng-Wen Wu
STOC
2003
ACM
98views Algorithms» more  STOC 2003»
16 years 7 months ago
A sublinear algorithm for weakly approximating edit distance
We show how to determine whether the edit distance between two given strings is small in sublinear time. Specifically, we present a test which, given two n-character strings A and...
Tugkan Batu, Funda Ergün, Joe Kilian, Avner M...
DATE
2000
IEEE
90views Hardware» more  DATE 2000»
15 years 11 months ago
Cost Reduction and Evaluation of a Temporary Faults Detecting Technique
: IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supply and speed. By approaching these limits, circuits are becoming increasingly ...
Lorena Anghel, Michael Nicolaidis