Scan chains are widely used to improve the testability of IC designs. In traditional 2D IC designs, various design techniques on the construction of scan chains have been proposed...
In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our...
Sorin Cotofana, Alexandre Schmid, Yusuf Leblebici,...
In Deep Sub-Micron (DSM) technologies, interconnects play a crucial role in the correct functionality and largely impact the performance of complex System-on-Chip (SoC) designs. F...
Informal educational experiences with grandparents and other older adults can be an important component of childrens education, especially in circumstances where high quality educ...
Allison Druin, Benjamin B. Bederson, Alexander J. ...
This paper treats the contemporary craft market as an under-researched resource for wearable computing, and investigates the alternative values and experiences that contemporary c...