9059 search results - page 246 / 1812 » The design of eco-feedback technology |
150
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DATE
2008
IEEE
16 years 1 months ago
2008
IEEE
Chip reliability becomes a great threat to the design of future microelectronic systems with the continuation of the progressive downscaling of CMOS technologies. Hence increasing...
205
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GLVLSI
2008
IEEE
16 years 1 months ago
2008
IEEE
With the scaling down of the CMOS technologies, Negative Bias Temperature Instability (NBTI) has become a major concern due to its impact on PMOS transistor aging process and the ...
173
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IV
2008
IEEE
16 years 1 months ago
2008
IEEE
Design rationale remains poorly explained and rarely modelled on projects in industry. However, the reasons for design decisions are important when a specification has to be re-ex...
165
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MICRO
2008
IEEE
16 years 1 months ago
2008
IEEE
—Negative bias temperature instability (NBTI), which reduces the lifetime of PMOS transistors, is becoming a growing reliability concern for sub-micrometer CMOS technologies. Par...
185
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ISCAS
2007
IEEE
16 years 1 months ago
2007
IEEE
— Design and analysis guidelines for resonant interconnect networks are presented in this paper. The methodology focuses on developing an accurate analytic distributed model of t...