518 search results - page 100 / 104 » Time Window Temporal Logic |
170
click to vote
DAC
2007
ACM
16 years 7 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
196
click to vote
FAST
2011
14 years 10 months ago
2011
: NAND flash-based solid-state drives (SSDs) are increasingly being deployed in storage systems at different levels such as buffer-caches and even secondary storage. However, the ...
181
click to vote
CF
2010
ACM
15 years 11 months ago
2010
ACM
We develop two simple interval-based models for dynamic superscalar processors. These models allow us to: i) predict with great accuracy performance and power consumption under va...
187
click to vote
CJ
2006
15 years 6 months ago
2006
Most microprocessor chips today use an out-of-order instruction execution mechanism. This mechanism allows superscalar processors to extract reasonably high levels of instruction ...
192
click to vote
DSN
2009
IEEE
16 years 1 months ago
2009
IEEE
The threat of soft error induced system failure in high performance computing systems has become more prominent, as we adopt ultra-deep submicron process technologies. In this pap...