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143
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ASPDAC
2001
ACM
15 years 10 months ago
2001
ACM
Loical defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fails testing. In the la...
166
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ASPDAC
2001
ACM
15 years 10 months ago
2001
ACM
Abstract--We present a processor-programmable built-in selftest (BIST) scheme suitable for embedded memory testing in the system-on-a-chip (SOC) environment. The proposed BIST circ...
154
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ASPDAC
2001
ACM
15 years 10 months ago
2001
ACM
- This paper presents encoding techniques to optimize the switching activity on a multiplexed DRAM address bus. The DRAM switching activity can be classified either as external (be...
164
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ASPDAC
2001
ACM
15 years 10 months ago
2001
ACM
Ethernet communication devices, such as adapter, hub, bridge and switch, all follow IEEE 802.3 standard protocol. We have designed and implemented an integrated 10/100 Mbps Etherne...
148
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ASPDAC
2001
ACM
15 years 10 months ago
2001
ACM
In this paper, we o introduce the Reusable Embedded In-Circuit Emulator (EICE) and Reusable EICE development system. The main function in EICE we design are testing and debugging. ...