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190
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ICCAD
2006
IEEE
16 years 4 months ago
2006
IEEE
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...
148
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ICCAD
2006
IEEE
16 years 4 months ago
2006
IEEE
- Redundant via insertion and line end extension employed in the post-routing stage are two well known and highly recommended techniques to reduce yield loss due to via failure. Ho...
187
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ICCAD
2006
IEEE
16 years 4 months ago
2006
IEEE
High power consumption will shorten battery life for handheld devices and cause thermal and reliability problems. One way to lower the dynamic power consumption is to reduce the s...
190
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ICCAD
2006
IEEE
16 years 4 months ago
2006
IEEE
Temperature monitoring using thermal sensors is an essential tool for evaluating the thermal behavior and sustaining the reliable operation in high-performance and high-power syst...
179
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ICCAD
2006
IEEE
16 years 4 months ago
2006
IEEE
Adaptive body biasing (ABB) is a powerful technique that allows post-silicon tuning of individual manufactured dies such that each die optimally meets the delay and power constrai...