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216
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DATE
2010
IEEE
16 years 11 days ago
2010
IEEE
—With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits...
179
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DATE
2010
IEEE
16 years 11 days ago
2010
IEEE
Abstract—Negative bias temperature instability (NBTI) significantly affects nanoscale integrated circuit performance and reliability. The degradation in threshold voltage (Vth) d...
184
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DATE
2010
IEEE
16 years 11 days ago
2010
IEEE
Abstract—We present a set of modeling constructs accompanied by a high performance simulation kernel for accuracy adaptive transaction level models. In contrast to traditional, ï...
164
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DATE
2010
IEEE
16 years 11 days ago
2010
IEEE
Abstract—Future microprocessors increasingly rely on an unreliable CMOS fabric due to aggressive scaling of voltage and frequency, and shrinking design margins. Fortunately, many...
195
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DATE
2010
IEEE
16 years 11 days ago
2010
IEEE
—Static and dynamic variations, which have negative impact on the reliability of microelectronic systems, increase with smaller CMOS technology. Thus, further downscaling is only...