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162
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EVOW
2008
Springer
15 years 9 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
208
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NIPS
2008
15 years 9 months ago
2008
We consider the problem of obtaining the approximate maximum a posteriori estimate of a discrete random field characterized by pairwise potentials that form a truncated convex mod...
179
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OL
2008
15 years 7 months ago
2008
By introducing redundant Klee-Minty examples, we have previously shown that the central path can be bent along the edges of the Klee-Minty cubes, thus having 2n - 2 sharp turns in...
187
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TON
1998
15 years 7 months ago
1998
Abstract—In this paper we consider routing and wavelength assignment in wavelength-routed all-optical networks with circuitswitching. The conventional approaches to address this ...
196
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TOG
2008
15 years 7 months ago
2008
We present a novel shadow map parameterization to reduce perspective aliasing artifacts for both point and directional light sources. We derive the aliasing error equations for bo...