1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
Anders Larsson, Erik Larsson, Petru Eles, Zebo Pen...
Abstract: High speed DRAMs today suffer from an increased sensitivity to interference and noise problems. Signal integrity issues, caused by bit line and word line coupling, result...
The network-on-chip (NoC) paradigm is seen as a way of facilitating the integration of a large number of computational and storage blocks on a chip to meet several performance and...
Sleep-wake protocols are critical in sensor networks to ensure long-lived operation. However, an open problem is how to develop efficient mechanisms that can be incorporated with ...