7380 search results - page 1094 / 1476 » time 2008 |
212
click to vote
ICCD
2008
IEEE
16 years 4 months ago
2008
IEEE
— The aggregate power consumption of the Internet is increasing at an alarming rate, due in part to the rapid increase in the number of connected edge devices such as desktop PCs...
248
click to vote
ICCD
2008
IEEE
16 years 4 months ago
2008
IEEE
— Run-time Active Leakage Reduction (RALR) is a recent technique and aims at aggressively reducing leakage power consumption. This paper studies the feasibility of RALR from the ...
190
click to vote
ICCAD
2008
IEEE
16 years 4 months ago
2008
IEEE
—The microprocessor verification challenge becomes higher in the on-chip bus (OCB) than in the unit-level. Especially for the external interrupts, since they interface with othe...
213
click to vote
ICCAD
2008
IEEE
16 years 4 months ago
2008
IEEE
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...
202
click to vote
ICCAD
2008
IEEE
16 years 4 months ago
2008
IEEE
—When manufacturing nano-devices, defects are a certainty and reliability becomes a critical issue. Until now, the most pervasive methods used to address reliability, involve inj...