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VLSID
1995
IEEE
104views VLSI» more  VLSID 1995»
15 years 10 months ago
A VLSI architecture for the computation of NURBS patches
Meenakshisundaram Gopi, Swami Manohar
VLSID
1995
IEEE
109views VLSI» more  VLSID 1995»
15 years 10 months ago
Logic minimization based approach for compressing image data
Jacob Augustine, Wen Feng, James Jacob
VLSID
1995
IEEE
113views VLSI» more  VLSID 1995»
15 years 10 months ago
VLSI design of systematic odd-weight-column byte error detecting SEC-DED codes
Luca Penzo, Donatella Sciuto, Cristina Silvano
VLSID
1995
IEEE
107views VLSI» more  VLSID 1995»
15 years 10 months ago
Functional test generation for non-scan sequential circuits
Mandyam-Komar Srinivas, James Jacob, Vishwani D. A...
VLSID
1995
IEEE
112views VLSI» more  VLSID 1995»
15 years 10 months ago
An efficient automatic test generation system for path delay faults in combinational circuits
Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...