211
Voted
DATE
2010
IEEE
16 years 2 days ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
194
Voted
ECCV
2004
Springer
16 years 11 days ago
2004
Springer
3D reconstruction from image data is required in many medical procedures. Recently, the use of fluoroscopy data to generate these 3D models has been explored. Most existing methods...