157
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DM
2008
15 years 7 months ago
2008
Motivated by a new point of view to study occurrences of consecutive patterns in permutations, we introduce the notion of uniquely k-determined permutations. We give two criteria f...
212
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ATS
2005
IEEE
16 years 19 days ago
2005
IEEE
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...